|
|
 |
| Posted: |
05 Mar 2008 |
| Published: |
03 Mar 2008 |
| Format: |
PDF
|
| Length: |
13
Page(s) |
| Type: |
White Paper |
| Language: |
English |
|
ABSTRACT:
Developers moving to multi-threaded applications often encounter an increasing amount of concurrency defects. Such defects possess an intense underlying complexity and are nearly impossible to replicate in a dynamic testing environment. They then slip easily past manual code review and traditional testing techniques, adversely affecting software quality.
This paper will review the most common pitfalls that software developers face when creating multi-threaded applications. Explore the innovative new software analysis capabilities that are designed to help development organizations manage the new world of multi-core hardware effectively. Discover how static analysis techniques can detect complex concurrency defects earlier in the development lifecycle, accelerating an organization's ability to produce and release multi-threaded applications.
|
 |
AUTHOR:
Ben Chelf
CTO, Coverity
|
|
|
|
BROWSE RELATED RESOURCES:
Simulation and Analysis Software | Software Development Methodologies | Software Development Tools | Software Quality Assurance | Software Testing | Vulnerability Management |
|
View All Resources
sponsored by Coverity, Inc. |
 |
|
|
|
Cramsession Research Library Copyright © 1998-2008 Bitpipe, Inc. All Rights Reserved. Designated trademarks and brands are the property of their respective owners. TechTarget · 117 Kendrick St · Needham, MA · 02494
Use of this web site constitutes acceptance of the Bitpipe Terms and Conditions and Privacy Policy. cramsession@bitpipe.com
|
